Ikeda Lab.

Publications

対外発表など

  • T. Iizuka, T. Nakura, and K. Asada, "Buffer-Ring-Based All-Digital On-Chip Monitor for PMOS and NMOS Process Variability and Aging Effects," IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Vienna, Austria, pp.167-172,Apr. 2010.
  • T. Nakura, S. Mandai, M. Ikeda, and K. Asada, "Time Difference Amplifier with Robust Gain Using Closed-Loop Control," IEICE Trans. on Electronics, Vol. E93-C, No. 3, pp. 303-308, Mar. 2010,
  • Mohamed Abbas, Tim Cheng, Yasuo Furukawa, Satoshi Komatsu and Kunihiro Asada "An Automatic Test Generation Framework for Digitally-Assisted Adaptive Equalizers in High Speed Serial Links," Design, Automation & Test in Europe 2010 (DATE 2010), pp. 272-275 2010.
  • T. Iizuka, D. Nakamura, H. Yoshida, S. Komatsu, M. Sasaki, M. Ikeda, and K. Asada, "An SoC Platform with On-Chip Web Interface for In-Field Monitoring," IEEE International SoC Design Conference, Pusan, Korea, pp.208-211,Nov. 2009,
  • S. Mandai, T. Nakura, M. Ikeda, and K. Asada, "Cascaded Time Difference Amplifier using Differential Logic Delay Cell," IEEE International SoC Design Conference, Pusan, Korea, pp.194-197,Nov. 2009,
  • S. Bushnaq, T. Nakura, M. Ikeda, K. Asada, "All Digital Wireless Transceiver Using Modified BPSK and 2/3 Sub-sampling Technique," IEEE International Conference on ASIC, Changsha, China, Oct. 2009,
  • S. Mandai, T. Nakura , M. Ikeda , K. Asada, "Dual Imager Core Chip with 24.8 rangemap/s 3-D and 58 fps 2-D Simultaneous Capture Capability," IEICE Trans. on Electronics, Vol. E92-C, No.6, Jun. 2009,
  • S. Mandai, T. Nakura, M. Ikeda, and K. Asada, "Ultra High Speed 3-D Image Sensor," International Image Sensor Workshop, Bergen, Norway, Jun. 2009,
  • S. Bushnaq, T. Nakura, M. Ikeda, K. Asada, "All Digital Baseband 50 Mbps Data Recovery Using 5x Oversampling With 0.9 Data Unit Interval Clock Jitter Tolerance," IEEE Design and Diagnostics of Electrical Circuits and Systems, Czech Republic, Apr. 2009,
  • M. Ikeda, H. Sumi "Report on ISSCC 2009 Medical Image Sensors Forum," IST2009-11, pp. 13-16, Information Sensing Research Committee, The Institute of Image Information and Television Engineers(ITE), Mar.2009.
  • S. Mandai and M. Ikeda, IEEE International Solid-State Circuit Conference(ISSCC), Student Forum, California, USA, SF-4-1,Feb. 2009,
  • K. Ikai, J. Kim, M. Ikeda and K. Asada, "Circuit Design Using Stripe-Shaped PMELA TFTs on Glass," Asia and South Pacific Design Automation Conference, pp. 105--106, Jan. 2009,
  • Mohamed Abbas, Yasuo Furukawa, Satoshi Komatsu and Kunihiro Asada, "Signature-Based Testing for Adaptive DigitallyCalibrated Pipelined Analog-to-Digital Converters," IEEE International Conference on ASIC (ASICON 2009), pp.287-292, 2009,
  • Mohamed Abbas, Tim Cheng, Yasuo Furukawa, Satoshi Komatsu and Kunihiro Asada, "GA-Based Test Generation for Digitally-Assisted Adaptive Equalizers in High-Speed Serial Links," IEEE EastWest Design & Test International Symposium 2009 (EWDTS2009) 2009,
  • Mohamed Abbas, Kwang-Ting Cheng, Yasuo Furukawa, Satoshi Komatsu, and Kunihiro Asada, "Signature-Based Testing for Digitally-Assisted Adaptive Equalizers in High-Speed Serial Links," IEEE European Test Symposium 2009 (ETS2009), pp.107-112, 2009,
  • S. Mandai, T. Nakura , M. Ikeda, K. Asada, " HIgh Resolution Time to Digital Converter using Time Difference Amplifier," IEICE Society Conference, Sep. 2009 , (in Japanese).
  • T. Nakura, S. Mandai, M. Ikeda, K. Asada, " Study on Time Difference Amplifier Using Feedback Control," CD2009-46, pp.69-74,, Oct. 2009 , (in Japanese).
  • S. Mandai, T. Nakura , M. Ikeda, K. Asada, " Multi Functional Dual Imager Core Chip," LSI and Systems Workshop, May 2009 , (in Japanese).
  • S. Mandai, T. Nakura , M. Ikeda, K. Asada, " Adaptive Row-Parallel Scan 3-D Image Sensor," IEICE General Conference,, Mar. 2009 , (in Japanese).
  • M. Jeong, M. Ikeda, K. Asada, " Dynamic Circuit Design for Selftimed Fine-grained Pipeline Architecture," IEICE General Conference,, Mar. 2009 , (in Japanese).