Ikeda Lab.

Publications

  • Z. Liang, M. Ikeda, K. Asada, "A Monte-Carlo Analysis of Static CMOS and Dual-Rail PLA for Sub-100nm Parameter Variations," in IEICE General Conference 2007,A-3-12,Mar. 2007, (in Japanese).
  • Y.S. CHO, M. Sasaki, M. Ikeda, K. Asada, in IEICE General Conference 2007,A-1-11,Mar. 2007, (in Japanese).
  • T. Kazama, M. Ikeda, and K. Asad, "LSI Design Flow for Shot Reduction of Character Projection Electron Beam Direct Writing Using Combined Cell Stencil," IEICE Trans. on Fundamentals, Vol. E89-A, No. 12, pp. 3546 -- 3550, Dec. 2006,
  • M. Ikeda, H. Yamauchi and K. Asada, "Tamper Resistivity Analysis for Nano-meter LSI with Process Variations," in Proc. of IEEE International Conference on Electronics, Circuits and Systems (ICECS), pp. 387 -- 390,Dec. 2006,
  • T. Iizuka, M. Ikeda, and K. Asada, "Timing-Driven Redundant Contact Insertion for Standard Cell Yield Enhancement," in Proc. of IEEE International Conference on Electronics, Circuits and Systems (ICECS), pp. 704 -- 707,Dec. 2006,
  • Y. Yachide, M. Ikeda, and K. Asada, "High-Speed 3-D Measurement System Using Smart Image Sensor and FPGA Based 3-D Engine," in Proc. of IEEE International Conference on Electronics, Circuits and Systems (ICECS), pp. 764 -- 767,Dec. 2006,
  • M. Sasaki, M. Ikeda, and K. Asada, "4-Gb/s low-power PRBS Generator with wave-pipeline technique in 0.18-um CMOS," in Proc. of IEEE International Conference on Electronics, Circuits and Systems (ICECS), pp. 1007 -- 1010,Dec. 2006,
  • M. Ikeda, K.H. Dia and K. Asada, "Pre-conditioning Free Footless DCVSL for High-performance Datapaths," in Proc. of IEEE International Conference on Electronics, Circuits and Systems (ICECS), pp. 1053 -- 1056,Dec. 2006,
  • H. Yoshida, M. Ikeda, and K. Asada, "Exact Minimum Logic Factoring via Quantified Boolean Satisfiability," in Proc. of IEEE International Conference on Electronics, Circuits and Systems (ICECS),pp. 1065 -- 1068,Dec. 2006,
  • T. Iizuka, M. Ikeda, and K. Asada, "Timing-Driven Redundant Contact Insertion for Standard Cell Yield Enhancement," in Proc. of IEEE International Conference on Electronics, Circuits and Systems (ICECS), pp. 704 -- 707,Dec. 2006,(Best Student Paper Award).
  • K. Asada "CMOS Image Sensors for Smart Applications," the 6th Taiwan-Japan Microelectronics International Symposium, Nov.2006.
  • M. Ikeda "University-Industry Collaboration for Nanometer CMOS Design," the 6th Taiwan-Japan Microelectronics International Symposium, Nov.2006.
  • T. Kazama, T. Nakura, M. Ikeda, and K. Asada, "Optimization of Active Substrate Noise Cancelling Technique using Power Line di/dt Detector," in Proc. of IEEE Asian Solid-State Circuits Conference(A-SSCC), pp. 239 -- 242,Oct. 2006,
  • K. Asada, Y. Yachide, Y. Oike, M. Ikeda "Real-Time High-Accuracy 3-D Imaging" in Proc. of International SoC Design Conference (ISOCC), Oct.2006.
  • Y. Yachide, M. Ikeda, and K. Asada, "Realization of Real-Time High-Accuracy Multiple-Viewpoint 3-D Imaging System," in Proc. of IEICE Society Conference 2006,A-1-17, p. 17,Sep. 2006, (in Japanese).
  • H. Yoshida, M. Ikeda, and K. Asada, "Synthesis of Read-Once Switch Network," in Proc. of IEICE Society Conference 2006,A-3-9, p. 53,Sep. 2006, (in Japanese).
  • T. Iizuka, M. Ikeda, and K. Asada, "Exact Minimum-Width Multi-Row Transistor Placement for Dual and Non-Dual CMOS Cells," in Proc. of IEICE Society Conference 2006,A-3-20, p. 64,Sep. 2006, (in Japanese).
  • T. Kazama, T. Nakura, M. Ikeda, and K. Asada, "Active Substrate Noise Cancelling Method using Multiple di/dt Detectors," in Proc. of IEICE Society Conference 2006,C-12-22, p. 83,Sep. 2006, (in Japanese).
  • K. Ishii, M. Ikeda, and K. Asada, "Evaluation of Dual-Rail Domino Logic," in Proc. of IEICE Society Conference 2006,C-12-34, p. 95,Sep. 2006, (in Japanese).
  • K. Asada "CMOS Smart Image Sensor-3D HS Meas," IEEE 2006 VAIL Computer Elements Workshop, Jun.2006.