Ikeda Lab.

Publications

対外発表など

  • T. Iizuka, M. Ikeda, and K. Asada, "Yield-Optimized Standard Cell Layout IP Synthesis System," the 8th IP Award from LSI IP Design Award CommitteesMay. 2006,(IP Award).
  • T. Iizuka, M. Ikeda, and K. Asada, "Timing-Driven Cell Layout De-Compaction for Yield Optimization by Critical Area Minimization," in Proc. of IEEE/ACM Design, Automation and Test in Europe (DATE), pp. 884 -- 889,Mar. 2006,
  • M. Abbas, M. Ikeda, and K. Asada, "On-Chip Detector for Single-Event Noise Sensing with Voltage Scaling Function," IEICE Trans. on Electron,Vol.E89-C, No.3, pp.370-376,Mar. 2006,
  • T. Nakura, M. Ikeda, and K. Asada, "Feedforward Active Substrate Noise Cancelling Based on di/dt of Power Supply," IEICE Trans. on Electron, Vol.E89-C, No.3, pp.364-369,Mar. 2006,
  • H. Yamauchi, M. Ikeda, K. Asada, "Degradation of Tamper Resistant LSI by Parameter Variation of Scaled Devices and its Countermeasures," IEICE Technical Report, IT2005-79, pp.87-92,Mar. 2006,
  • T. Iizuka, M. Ikeda, and K. Asada, "Exact Minimum-Width Multi-Row Transistor Placement for Dual and Non-Dual CMOS Cells," in Proc. of IEEE International Symposium on Circuits and Systems (ISCAS), pp. 5431 -- 5434,May 2006,
  • T. Iizuka, M. Ikeda, and K. Asada, "Exact Minimum-Width Transistor Placement for Dual and Non-Dual CMOS Cells," IEICE Trans. on Fundamentals,Vol. E88-A, No. 12, pp. 3485 -- 3491, Dec. 2005,
  • T. Nakura, M. Ikeda, and K. Asada, "On-chip di/dt Detector IP for Power Supply," in Proc. of IP Based SoC Design Conference & Exhibition (IP-SOC), pp.160 -- 164,Dec. 2005,
  • H. Yoshida, M. Ikeda, and K. Asada, "An Algebraic Approach for Transistor Circuit Synthesis," in Proc. of IEEE International Conference on Electronics, Circuits, and Systems (ICECS), pp. --,Dec. 2005,
  • M. Abbas, M. Ikeda, and K. Asada, "On-Chip Non-Periodic High-Swing Noise Detector," in Proc. of IEEE International Conference on Electronics, Circuits, and Systems (ICECS), pp. --,Dec. 2005,
  • T. Iizuka, M. Ikeda, and K. Asada, "Timing-Driven Cell Layout De-Compaction for Yield Optimization by Critical Area Minimization," IEICE Technical Report, vol. 105, no. 442, pp. 79 - 84,Dec. 2005,
  • H. Yoshida, M. Ikeda, and K. Asada, "Exact Minimum Logic Factoring via Quantified Boolean Satisfiability," IEICE Technical Report, vol. 105, no. 443, pp. 41 - 46,Dec. 2005,
  • T. Nakura, M. Ikeda, and K. Asada, "On-chip di/dt Detector IP for Power Supply," IP Based SoC Design Conference & Exhibition (IP-SOC)Dec. 2005,(Best Paper Award).
  • K. H. Dia, R. Zheng, M. Ikeda, and K. Asada, "Footless Dual-Rail Domino Circuit with Self-Timed Precharge Scheme," in Proc. of IEEE Asian Solid-State Circuits Conference (A-SSCC), pp. 309 -- 312,Nov. 2005,
  • M. Ikeda, Y. Yachide, Y. Oike, and K. Asada, "Wavelength Identification Sensor Using MOS Photo-transistor Array Based on Metal Slit Diffraction," in Proc. of International Conference on Sensing Technology (ICST), pp. 683 -- 686,Nov. 2005,
  • K. Yamamoto, M.Ikeda, and K. Asada, "Stereo Vision with Random Pattern Light Projection," ITE Technical Report, vol. 29, no. 67, pp. 13 - 16,Nov. 2005,
  • M. Abbas, M. Ikeda, and K. Asada, "On-chip Detector for Non-Periodic High-Swing Noise Detection," in Proc. of International SoC Design Conference (ISOCC), pp. 231 -- 234,Oct. 2005,
  • T.Kazama, M. Ikeda, and K. Asada, "Shot Reduction Technique for Character Projection Lithography using combined cell stencil," in Proc. of SPIE BACUS Symposium on Photomask Technology, pp. 5992-5996,Oct. 2005,
  • M. Abbas, M. Ikeda and K. Asada, "On-chip Detector for Non-Periodic High-Swing Noise Sensing," in Proc. of International SOC Design Conference (ISOCC), pp.231-234,Oct. 2005,
  • T. Nakura, M. Ikeda, and K. Asada, "Autonomous di/dt Noise Control Scheme for Margin Aware Operation," IEEE European Solid-State Circuit Conference (ESSCIRC), sess.8.G.2, pp.467-470, Sep. 2005,